Direct observation and kinetic analysis of grain rotation in anisotropic tin under electromigration
Direct observation and kinetic analysis of grain rotation in anisotropic tin under electromigration
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DOI：
10.1063/1.2901155
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发表时间：
2008-03
影响因子：
4
通讯作者：
A. Wu;Y. Hsieh
中科院分区：
文献类型：
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作者：
A. Wu;Y. Hsieh
由于电迁移过程中材料的各向异性和随之而来的晶粒旋转，β-tin的电阻在电迁移下降低了10%。非原位测量颗粒的直径，并直接计算旋转颗粒的角度。旋转晶粒的角度与施加电流的时间成比例地增加。在较高的温度下，电迁移效应更强，观察到一个意想不到的旋转行为。讨论了在各种试验条件下原子沿a轴和c轴沿着运动的动力学。
The resistance of β-tin decreases by 10% under electromigration because of the anisotropic properties of the material during electromigration and the consequent rotation of grains. The diameter of the grains was measured ex situ and the angle of the rotating grains was directly calculated. The angle of rotating grains increased in proportion to the time for which the current was applied. At higher temperature, at which electromigration effect was stronger, an unexpected rotation behavior was observed. The kinetics of atomic movement along the a and c axes under various test conditions is discussed.