A Noise-Temperature Measurement System Using a Cryogenic Attenuator
A Noise-Temperature Measurement System Using a Cryogenic Attenuator
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使用低温衰减器的噪声温度测量系统
DOI：
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发表时间：
1998
期刊：
影响因子：
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通讯作者：
J. Fernandez
中科院分区：
文献类型：
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作者：
J. Fernandez
本文描述了一种方法，以获得准确和可重复的低温冷却低噪声放大器的输入噪声温度测量，使用商用噪声-流量计，结合低温衰减器与待测放大器位于同一位置。还讨论了所用的校准技术。准确和快速的噪声温度测量对于高电子迁移率晶体管（HEMT）低温冷却放大器的建模和开发至关重要。在实验室中使用了四种不同的技术来测量低温冷却放大器的噪声温度，每种技术的描述如下。接下来，介绍了低温垫法，这是喷气推进实验室低温电子前端设备组最常用的方法。虽然低温垫和噪声-仪表本身并不是新的，但将它们结合起来提供了一个优雅，简单，快速的解决方案，以等效输入噪声-温度和增益测量。
This article describes a method to obtain accurate and repeatable input noisetemperature measurements of cryogenically cooled low-noise ampliflers using a commercial noise-flgure meter in conjunction with a cryogenic attenuator co-located with the amplifler under test. The calibration techniques used also are discussed. I. Introduction Accurate and rapid noise-temperature measurements are critical to the modeling and development of high electron mobility transistor (HEMT) cryogenically cooled ampliflers. Four difierent techniques have been used in the laboratory to make noise-temperature measurements of cryogenically cooled ampliflers, and each of these is described below. Following this, the cryogenic pad method, the method most often used by the Cryogenics{Electronics Front-End Equipment Group at JPL, is described. Although the cryogenic pad and noise-flgure meter are not in and of themselves new, combining them provides an elegant, simple, and quick solution to equivalent input noise-temperature and gain measurements.