Experimental high-resolution electron microscopy of polymers
Experimental high-resolution electron microscopy of polymers
复制标题
聚合物的实验高分辨率电子显微镜
DOI：
10.1016/0032-3861(95)90922-o
复制
发表时间：
1995
期刊：
影响因子：
4.6
通讯作者：
E. Thomas
中科院分区：
文献类型：
--
作者：
David C. Martin;E. Thomas
High-resolution imaging of ordered polymers is described both theoretically and experimentally. The relationship between the actual three-dimensional specimen structure and the resultant two-dimensional image intensity distribution is developed using the multislice formalism. The influence of the electron optical conditions on the image is demonstrated with experimental data, as well as with image simulations. Practical details of specimen preparation, as well as the effects of specimen structural defects on the image, are presented. A significant challenge for polymer microscopists is to minimize the deleterious effects of electron beam damage and to identify image artifacts resulting from damage. Future applications of ultrahigh-resolution capabilities are illustrated with respect to direct imaging of the anisotropic potentials present in covalently bonded materials.
