SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy.
SIMcheck: a Toolbox for Successful Super-resolution Structured Illumination Microscopy.
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DOI：
10.1038/srep15915
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发表时间：
2015-11-03
影响因子：
4.6
通讯作者：
Schermelleh L
中科院分区：
文献类型：
--
作者：
Ball G;Demmerle J;Kaufmann R;Davis I;Dobbie IM;Schermelleh L
三维结构照明显微镜（3D-SIM）是一种多功能且易于使用的超分辨率荧光成像方法，但生成高质量数据具有挑战性，特别是对于非专业用户。我们提出了SIMcheck，一套ImageJ插件，使用户能够识别和避免3D-SIM数据的常见问题，并通过客观的控制参数来评估分辨率和数据质量。此外，SIMcheck还为常见的图像处理任务提供高级校准工具和实用程序。该开源软件适用于所有商业和定制平台，并将促进超分辨率SIM成像在细胞生物学中的常规应用。
Three-dimensional structured illumination microscopy (3D-SIM) is a versatile and accessible method for super-resolution fluorescence imaging, but generating high-quality data is challenging, particularly for non-specialist users. We present SIMcheck, a suite of ImageJ plugins enabling users to identify and avoid common problems with 3D-SIM data, and assess resolution and data quality through objective control parameters. Additionally, SIMcheck provides advanced calibration tools and utilities for common image processing tasks. This open-source software is applicable to all commercial and custom platforms, and will promote routine application of super-resolution SIM imaging in cell biology.