An improved wedge calibration method for lateral force in atomic force microscopy
An improved wedge calibration method for lateral force in atomic force microscopy
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DOI：
10.1063/1.1584082
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发表时间：
2003-07-01
影响因子：
1.6
通讯作者：
Halperin, G
中科院分区：
文献类型：
--
作者：
Varenberg, M;Etsion, I;Halperin, G
提出了一种用于原子力显微镜中定量横向力测量的改进楔形校准方法。改进后的方法与原来的方法在几个方面有所不同。它采用了一个更简单的，市售的校准光栅，可以在任何单一的指定负载下进行。它可以校准所有类型的探针，既集成了尖锐的尖端，也可以校准任何曲率半径不超过2微米的胶体。改进后的方法利用标定光栅上的平面来抵消系统误差，大大简化了标定系数的计算。提出了一种横向力在线标定的数据处理方案。(C) 2003年美国物理研究所。
An improved wedge calibration method for quantitative lateral force measurement in atomic force microscopy is presented. The improved method differs from the original one in several aspects. It utilizes a much simpler, commercially available, calibration grating and can be performed at any single specified applied load. It enables calibration of all types of probes, both integrated with sharp tips, and colloidal with any radius of curvature up to 2 mum. The improved method also simplifies considerably the calculation of the calibration factor by using flat facets on the calibration grating to cancel out system errors. A scheme for the data processing for on-line calibration of the lateral force is also presented. (C) 2003 American Institute of Physics.