Towards Mapping Perovskite Oxide 3-D Structure Using Two-Dimensional Pixelated STEM Detector
Towards Mapping Perovskite Oxide 3-D Structure Using Two-Dimensional Pixelated STEM Detector
复制标题
使用二维像素化 STEM 探测器绘制钙钛矿氧化物 3-D 结构
DOI:
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发表时间:
2016
影响因子:
2.8
通讯作者:
I. MacLaren
中科院分区:
文献类型:
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作者:
M. Nord;Andrew Ross;I. Hallsteinsen;T. Tybell;I. MacLaren
Perovskite materials can exhibit a wide range of properties like superconductivity, magnetism and piezoelectricity. These diverse functional properties emerge due to strong structure – function coupling. Small changes in lattice structure can lead to large changes in functional properties. In particular, perovskite heterostructures have recently attracted much interest due to the possibility of tailoring properties through coupling between substrate and film. However, due to the many different parameters that can affect the properties of these materials, one needs detailed information about the structure of the films, especially at the film/substrate interface. In particular, the promotion or suppression of octahedral tilt ordering at interfaces, and the measurement of this using scanning transmission electron microscopy (STEM) is of great interest [1-3]. Ideally one wants to have precise information about every atom position to get the full 3-D structure. Using STEM one can normally get high resolution structural information about the axes orthogonal to the electron beam, however this still leaves one axis unaccounted for. Normally, two different TEM-lamellae thinned on two orthogonal zone axes is required to get this information about all three axes. However, extracting all this from one region of one sample would obviously be advantageous.