Microstructural characterization of terbium-doped ceria
Microstructural characterization of terbium-doped ceria
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DOI：
10.1016/j.materresbull.2006.08.007
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发表时间：
2007-05
影响因子：
5.4
通讯作者：
F. Ye;T. Mori;D. Ou;J. Zou;J. Drennan
中科院分区：
文献类型：
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作者：
F. Ye;T. Mori;D. Ou;J. Zou;J. Drennan
利用透射电子显微镜系统地研究了Ce1−xTbxO2−δ（0.10≤x≤0.50）烧结样品的显微结构。烧结后的样品不仅由萤石结构的基体组成，而且还含有纳米尺寸的沉淀物。相应地，在选定区域的衍射图案中观察到与沉淀物相关的漫散射和额外反射。通过电子能量损失谱对沉淀物的组成进行了定量研究，表明沉淀物具有比基体更高的Tb浓度。此外，观察到Tb 3+和Ce 3+阳离子在沉淀物中偏析。
The microstructures of Ce1−xTbxO2−δ(0.10≤x≤0.50) sintered samples were studied systematically using transmission electron microscopy. The sintered samples consist of not only fluorite-structured matrix but also nano-sized precipitates. Correspondingly, diffuse scattering and extra reflections related to the precipitates were observed in the selected area diffraction patterns. The composition of the precipitates was studied quantitatively by electron energy-loss spectroscopy, indicating that the precipitates have higher Tb concentration than that of the matrix. Furthermore, Tb3+and Ce3+cations were observed to segregate in the precipitates.