Best-case performance of quantum annealers on native spin-glass benchmarks: How chaos can affect success probabilities
Best-case performance of quantum annealers on native spin-glass benchmarks: How chaos can affect success probabilities
复制标题
量子退火机在原生自旋玻璃基准上的最佳性能:混沌如何影响成功概率
DOI:
10.1103/physreva.93.012317
复制
发表时间:
2015
影响因子:
2.9
通讯作者:
H. Katzgraber
中科院分区:
文献类型:
--
作者:
Zheng Zhu;Andrew J. Ochoa;Stefan Schnabel;F. Hamze;H. Katzgraber
Recent tests performed on the D-Wave Two quantum annealer have revealed no clear evidence of speedup over conventional silicon-based technologies. Here we present results from classical parallel-tempering Monte Carlo simulations combined with isoenergetic cluster moves of the archetypal benchmark problem---an Ising spin glass---on the native chip topology. Using realistic uncorrelated noise models for the D-Wave Two quantum annealer, we study the best-case resilience, i.e., the probability that the ground-state configuration is not affected by random fields and random-bond fluctuations found on the chip. We thus compute classical upper-bound success probabilities for different types of disorder used in the benchmarks and predict that an increase in the number of qubits will require either error correction schemes or a drastic reduction of the intrinsic noise found in these devices. We restrict this study to the exact ground state, however, the approach can be trivially extended to the inclusion of excited states if the success metric is relaxed. We outline strategies to develop robust, as well as hard benchmarks for quantum annealing devices, as well as any other (black box) computing paradigm affected by noise.