Towards the three‐dimensional field ion microscope
Towards the three‐dimensional field ion microscope
复制标题
走向三维场离子显微镜
DOI：
10.1002/sia.2490
复制
发表时间：
2007
影响因子：
1.7
通讯作者：
B. Deconihout
中科院分区：
文献类型：
--
作者：
F. Vurpillot;M. Gilbert;B. Deconihout
利用一部场离子显微镜电影的连续图像重建了三维场离子显微镜(FIM)图像。这一能力为用FIM观察各种结晶学特征开辟了一个新的维度，如空位、位错、晶界或沉淀。通过将图像叠加到3D矩阵中，AlSm合金中的暗成像沉淀物可以在三维中重建。实验证明，该仪器的深度分辨率优于0.05 nm，横向分辨率优于0.3 nm。这使得可以在3D中观察到Fe中的位错。然而，原始重建图略有扭曲。原子线是弯曲的，因为基本的重建方法没有充分考虑样品尖端的形状。提出了一种改进的重建方法。版权所有©2007 John Wiley&Sons，Ltd.
Three‐dimensional field ion microscope (FIM) images have been reconstructed using the successive images of an FIM movie. This capability opens a new dimension to the observation with the FIM of various crystallographic features, such as vacancies, dislocations, grain boundaries or precipitates. By piling up the images in a 3D matrix, darkly imaging precipitates in an AlSm alloy are reconstructed in three dimensions. The resolution of the instrument is proved to be better than 0.05 nm in depth and 0.3 nm laterally in favourable cases. This enables a dislocation in Fe to be observed in 3D. Raw reconstructions are, however, slightly distorted. Atomic lines are curved because the basic reconstruction method does not fully take into account the shape of the sample tip. An improved reconstruction method is proposed. Copyright © 2007 John Wiley & Sons, Ltd.