A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
A Simulator of Small-Delay Faults Caused by Resistive-Open Defects
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DOI：
10.1109/ets.2008.19
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发表时间：
2008-05
期刊：
影响因子：
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通讯作者：
A. Czutro;N. Houarche;P. Engelke;I. Polian;M. Comte;M. Renovell;B. Becker
中科院分区：
文献类型：
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作者：
A. Czutro;N. Houarche;P. Engelke;I. Polian;M. Comte;M. Renovell;B. Becker
我们提出了一个模拟器，它确定了小延迟故障的覆盖率，即，由连续开路缺陷引起的大小小于一个时钟周期的延迟故障。这些缺陷很可能通过固定或过渡故障模式而逃避检测。对于第一次，我们耦合的小延迟故障的临界尺寸的计算与相应的连续开放的缺陷，这个尺寸被超过的电阻范围的计算。通过这样做，我们能够扩展概率故障覆盖度量最初开发的静态电阻桥接故障小延迟缺陷。
We present a simulator which determines the coverage of small-delay faults, i.e., delay faults with a size below one clock cycle, caused by resistive-open defects. These defects are likely to escape detection by stuck-at or transition fault patterns. For the first time, we couple the calculation of the critical size of a small-delay fault with the computation of the resistance range of the corresponding resistive-open defect for which this size is exceeded. By doing so, we are able to extend probabilistic fault coverage metrics initially developed for static resistive bridging faults to small-delay defects.