Detecting bridging faults with stuck-at test sets
Detecting bridging faults with stuck-at test sets
复制标题
使用固定测试装置检测桥接故障
DOI：
10.1109/test.1988.207864
复制
发表时间：
1988
期刊：
影响因子：
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通讯作者：
E. McCluskey
中科院分区：
文献类型：
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作者：
S. Millman;E. McCluskey
描述了一种方法，其提供桥接故障的高检测而不需要广泛的故障模拟。桥接故障覆盖率可以通过对被识别为难以检测的桥接故障进行故障模拟和测试生成来增加。这些桥接故障发生在很少（如果有的话）不同或很少改变值的节点之间。此外，如果无故障电路中的节点经常切换，则更容易检测到反馈故障。即使所涉及的节点总是具有相等的值，也是如此。已经提出了用于识别这样的节点的方法。这些方法使用无故障模拟的结果。一个简单的解决方案是随机重新排序测试向量，以增加切换，从而增加桥接故障覆盖率。因此，测试生成的计算机时间将仅略大于仅生成固定故障所需的时间。<<ETX>>
A method is described that provides high detection of bridging faults without requiring extensive fault simulation. Bridging fault coverage can be increased by doing fault simulation and test generation for bridging faults that are identified as hard to detect. These bridging faults occur between nodes that rarely, if ever, differ, or that seldom change value. In addition, if the nodes in the fault-free circuits toggle often, feedback faults are easier to detect. This is true even if the nodes involved always have equal values. Methods for identifying such nodes have been presented. These methods use results available from fault-free simulations. A simple solution is to randomly reorder the test vectors to increase toggling and therefore increase bridging fault coverage. As a result, computer time for test generation will be only slightly greater than the time required for stuck-at fault generation alone.<<ETX>>