Electronic properties for the C2v and Cs isomers of Pr@C82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy
Electronic properties for the C2v and Cs isomers of Pr@C82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy
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DOI：
10.1016/j.cplett.2004.07.072
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发表时间：
2004-09
影响因子：
2.8
通讯作者：
T. Hosokawa;S. Fujiki;Eiji Kuwahara;Y. Kubozono;H. Kitagawa;A. Fujiwara;T. Takenobu;Y. Iwasa
中科院分区：
文献类型：
--
作者：
T. Hosokawa;S. Fujiki;Eiji Kuwahara;Y. Kubozono;H. Kitagawa;A. Fujiwara;T. Takenobu;Y. Iwasa
