Spectral confocal reflection microscopy using a white light source
Spectral confocal reflection microscopy using a white light source
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DOI：
10.2971/jeos.2008.08026
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发表时间：
2008-01-01
影响因子：
1.5
通讯作者：
Wilson, Tony
中科院分区：
文献类型：
--
作者：
Booth, Martin J.;Juskaitis, Rimas;Wilson, Tony
我们提出了一个反射共聚焦显微镜结合白光超连续源和光谱检测。除了光谱分辨率覆盖450-650 nm波长范围外，显微镜还提供三维空间分辨率的图像。人工和自然标本的图像和反射光谱显示的特征，通常不会显示在传统显微镜或共聚焦显微镜使用离散线激光。这些标本包括半导体芯片上的薄膜结构、凤蝶鳞片上的虹彩结构、鲍鱼壳上的珍珠和蛋白石宝石。透明珠的定量尺寸和折射率测量是由光谱干涉带导出的。(DOI: 10.2971 / jeos.2008.08026)
We present a reflection confocal microscope incorporating a white light supercontinuum source and spectral detection. The microscope provides images resolved spatially in three-dimensions, in addition to spectral resolution covering the wavelength range 450-650 nm. Images and reflection spectra of artificial and natural specimens are presented, showing features that are not normally revealed in conventional microscopes or confocal microscopes using discrete-line lasers. The specimens include thin film structures on semiconductor chips, iridescent structures in Papilio blumei butterfly scales, nacre from abalone shells and opal gemstones. Quantitative size and refractive index measurements of transparent beads are derived from spectral interference bands. [DOI: 10.2971/jeos.2008.08026]