Monitoring statistical magnetic fluctuations on the nanometer scale.
Monitoring statistical magnetic fluctuations on the nanometer scale.
复制标题
监测纳米尺度的统计磁波动。
DOI：
10.1103/physrevlett.89.127201
复制
发表时间：
2002
影响因子：
8.6
通讯作者：
J. Furdyna
中科院分区：
文献类型：
--
作者：
G. Bacher;A. A. Maksimov;H. Schömig;V. Kulakovskii;M. Welsch;A. Forchel;P. Dorozhkin;A. Chernenko;S. Lee;M. Dobrowolska;J. Furdyna
Statistical fluctuations of the magnetization are measured on the nanometer scale. As the experimental monitor we use the characteristic photoluminescence signal of a single electron-hole pair confined in one magnetic semiconductor quantum dot, which sensitively depends on the alignment of the magnetic ion spins. Quantitative access to statistical magnetic fluctuations is obtained by analyzing the linewidth broadening of the single dot emission. Our all-optical technique allows us to address a magnetic moment of only approximately equal 100 micro(B) and to resolve statistical changes on the order of a few micro(B).
