An on-die all-digital power supply noise analyzer with enhanced spectrum measurements

An on-die all-digital power supply noise analyzer with enhanced spectrum measurements
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具有增强频谱测量功能的片上全数字电源噪声分析仪

DOI:
10.1109/jssc.2015.2431071
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发表时间:
2015
期刊:
ESSCIRC 2014 - 40th European Solid State Circuits Conference (ESSCIRC)
影响因子:
--
通讯作者:
B. Casper
B. Casper
中科院分区:
--
文献类型:
--
作者:
Tzu;F. O’Mahony;M. Mansuri;B. Casper

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本文提出了一种可扩展的全数字电源噪声分析仪,采样带宽为20GHz,分辨率为1mV,采用32nm CMOS实现。这种基于平均的分析仪测量电源噪声在等效时间和频域与低分辨率vco为基础的采样器。对于频域测量,它使用数字随机相位噪声累积来消除电源噪声和采样时钟之间的相关性。此外,还在芯片上测量了等效时间电流阶跃响应,以表征输电网络的频域阻抗。
This paper presents a scalable all-digital power supply noise analyzer with 20GHz sampling bandwidth and 1mV resolution implemented in 32nm CMOS. This averaging-based analyzer measures power supply noise in both the equivalent-time and frequency domain with low-resolution VCO-based samplers. For frequency-domain measurements, it uses digital random phase-noise accumulation to remove correlation between the power supply noise and sampling clocks. In addition, the equivalent-time current step response is measured on-die to characterize the frequency-domain impedance of the power delivery network.