Development of surface magneto-transport measurement with micro-four-point probe method and the measurement of Bi nanofilm on Si(111)
Development of surface magneto-transport measurement with micro-four-point probe method and the measurement of Bi nanofilm on Si(111)
复制标题
微型四点探针法表面磁输运测量及Si(111)上Bi纳米膜测量的进展
DOI：
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发表时间：
2011
影响因子：
1.5
通讯作者：
I.Matsuda
中科院分区：
文献类型：
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作者：
N.Miyata;R.Hobara;H.Narita;T.Hirahara;S.Hasegawa;I.Matsuda
