Evaluations of oxygen impurities in Ge crystals Czochralski-grown from melts partially or fully covered by B_2O_3 liquid, Proc

Evaluations of oxygen impurities in Ge crystals Czochralski-grown from melts partially or fully covered by B_2O_3 liquid, Proc
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从部分或完全被 B_2O_3 液体覆盖的熔体中直拉生长的 Ge 晶体中氧杂质的评估,Proc

DOI:
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发表时间:
2010
期刊:
The Forum on the Science and Technology of Silicon Materials
影响因子:
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通讯作者:
I. Yonenaga
I. Yonenaga
中科院分区:
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文献类型:
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作者:
T. Taishi;Y. Hashimoto;H. Ise;Y. Murao;T. Ohsawa;Y. Tokumoto;Y. Ohno;I. Yonenaga

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