Depolarization corrections to the coercive field in thin-film ferroelectrics
Depolarization corrections to the coercive field in thin-film ferroelectrics
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DOI：
10.1088/0953-8984/15/24/106
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发表时间：
2003-06-25
影响因子：
2.7
通讯作者：
Scott, JF
中科院分区：
文献类型：
--
作者：
Dawber, M;Chandra, P;Scott, JF
经验表明，铁电体中扭转极化所需的矫顽力场随薄膜厚度的减小而增大。对于厚度为100 ~ 100 nm的铁电薄膜，用半经验标度定律成功地描述了矫顽力场。考虑到去极化校正，我们表明这种缩放行为与薄膜厚度低至一纳米的超薄铁电电容器的现场测量一致。我们的研究结果还表明，由极化不稳定性决定的最小薄膜厚度可以通过电极的选择来调整，并讨论了下一代铁电器件的建议。
Empirically, the coercive field needed to reverse the polarization in a ferroelectric increases with decreasing film thickness. For ferroelectric films of 100 mum to 100 nm in thickness the coercive field has been successfully described by a semi-empirical scaling law. Accounting for depolarization corrections, we show that this scaling behaviour is consistent with field measurements of ultrathin ferroelectric capacitors down to one nanometre in film thickness. Our results also indicate that the minimum film thickness, determined by a polarization instability, can be tuned by the choice of electrodes, and recommendations for next-generation ferroelectric devices are discussed.