The doping method in quantitative X-ray diffraction phase analysis
The doping method in quantitative X-ray diffraction phase analysis
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DOI：
10.1107/s0021889879012188
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发表时间：
1979-04
影响因子：
6.1
通讯作者：
S. Popović;B. Gržeta-Plenković
中科院分区：
文献类型：
--
作者：
S. Popović;B. Gržeta-Plenković
介绍了X射线衍射物相定量分析中的掺杂方法。该方法涉及将已知量的组分添加到所研究的体系中，其重量分数将被同时测定。组分的重量分数与该组分和任何未添加组分在掺杂前后的衍射强度有关。该方法还可以应用于含有未知成分的系统，只分析感兴趣的那些成分，以及测定无定形含量。
The doping method in quantitative X-ray diffraction phase analysis is described. The method involves the addition to the investigated system of known amounts of the components, the weight fractions of which are to be simultaneously determined. The weight fraction of a component is related to the intensities diffracted by that component and by any non-added component, before and after doping. The method can also be applied to systems containing unidentified components by analysing for only those components of interest, as well as for amorphous-content determination.