Further collapses in TFNP

Further collapses in TFNP
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TFNP进一步崩溃

DOI:
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发表时间:
2022
期刊:
Electron. Colloquium Comput. Complex.
影响因子:
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通讯作者:
Ran Tao
Ran Tao
中科院分区:
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文献类型:
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作者:
Mika Goos;Alexandros Hollender;Siddhartha Jain;Gilbert Maystre;William Pires;Robert Robere;Ran Tao

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我们证明EOPL = PLS PPAD。在这里,EOPL类由所有的总搜索问题组成,这些问题可以简化为电位线末端问题,这是Hubáček和Yogev(SICOMP 2020)和Fearnley等人(JCSS 2020)在工作中引入的。特别是,我们的结果产生了Fearnley等人(STOC 2021)的突破崩溃CLS = PLS PPAD的新的更简单的证明。我们还证明了一个同伴的结果SOPL = PLS <$PPADS,其中SOPL是与潜在的线汇问题的类。
We show EOPL = PLS ∩ PPAD. Here the class EOPL consists of all total search problems that reduce to the End-of-Potential-Line problem, which was introduced in the works by Hubáček and Yogev (SICOMP 2020) and Fearnley et al. (JCSS 2020). In particular, our result yields a new simpler proof of the breakthrough collapse CLS = PLS ∩ PPAD by Fearnley et al. (STOC 2021). We also prove a companion result SOPL = PLS ∩ PPADS, where SOPL is the class associated with the Sink-of-Potential-Line problem.
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影响因子: --
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