X-ray imaging with parametric X-rays (PXR) from a lithium fluoride (LiF) crystal
X-ray imaging with parametric X-rays (PXR) from a lithium fluoride (LiF) crystal
复制标题
使用氟化锂 (LiF) 晶体的参量 X 射线 (PXR) 进行 X 射线成像
DOI：
10.1016/j.nima.2006.01.054
复制
发表时间：
2006
影响因子：
1.4
通讯作者：
R. Block
中科院分区：
文献类型：
--
作者：
B. Sones;Y. Danon;R. Block
报道了参量X射线（PXR）产生的X射线成像。PXR是利用能量为56MeV、电流高达6.4μA的电子束与1.5mm厚的LiF晶体靶相互作用产生的。采用LiF（220）晶面，布拉格角（θB）接近15°，产生能量为16.6keV，半高宽为3%的PXR。这种强烈的，定向的，可调的X射线源，然后被用来成像一条小鱼，一个集成电路，和一个电子开关与增强CCD相机。来自靶晶体的韧致辐射被表征为噪声源，并与PXR进行比较。
X-ray imaging produced by parametric X-rays (PXR) is reported. The PXR are generated using an electron beam with energy of 56MeV and currents up to 6.4μA, that interacted with a 1.5-mm thick lithium fluoride (LiF) crystal target in Laue geometry. The LiF (220) crystallographic plane was used with a Bragg angle (θB) near 15° to produce PXR with energy 16.6keV and FWHM of 3%. This intense, directional, and tunable X-ray source was then used to image a small fish, an integrated circuit, and an electrical switch with an intensified CCD camera. The bremsstrahlung from the target crystal is characterized as a source of noise and compared to the PXR.