FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
FTIR Ellipsometry Study on RF sputtered Permalloy-Oxide Thin Films
复制标题
射频溅射坡莫合金氧化物薄膜的 FTIR 椭圆光度研究
DOI：
10.1557/adv.2016.427
复制
发表时间：
2016
期刊：
影响因子：
0.8
通讯作者：
S. Zollner
中科院分区：
文献类型：
--
作者：
Md. Abdul Ahad Talukder;Yubo Cui;M. Compton;W. Geerts;L. Scolfaro;S. Zollner
用变角椭偏仪研究了射频溅射多晶坡莫合金氧化物(PYO)薄膜在红外波段的光学性质。PYO的分散在381.5 cm^-1处出现一个洛伦兹分散峰。我们将这一峰值归因于PYO的横向光学声子。该峰与Ni_(0.81)Fe_(0.19)O_(1-d)薄膜的岩盐晶体结构相一致。
The optical properties of RF sputtered polycrystalline permalloy oxide (PyO) thin films were studied in the infrared by variable angle ellipsometry. The dispersion of PyO shows a Lorentzian dispersion peak at 381.5 cm^-1. We attribute this peak to the transverse optical phonon of PyO. This peak is consistent with a rocksalt crystal structure for the Ni_0.81Fe_0.19O_1-d thin films.