Relaxation of transient ionization in the lower ionosphere
Relaxation of transient ionization in the lower ionosphere
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DOI：
10.1029/98ja00016
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发表时间：
1998-04
影响因子：
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通讯作者：
C. Rodger;O. Molchanov;N. Thomson
中科院分区：
文献类型：
--
作者：
C. Rodger;O. Molchanov;N. Thomson
本文提出了一组描述高层大气和低层电离层弛豫的基本表达式和参数。空间（扩散）和化学损失都包括在内，沿着变化的电子密度和温度引起的电导率。特别是，在这些高海拔地区的附着率和重组系数的合理值进行了讨论。例子计算涉及到红色精灵的研究。然而，建模和参数不限于这些事件，并且在许多其他建模问题中可能很有用。
This paper presents a set of basic expressions and parameters to describe the relaxation of ionization in the upper atmosphere and lower ionosphere. Both spatial (diffusion) and chemical loss are included, along with the varying electrical conductivity caused by changing electron density and temperature. In particular, reasonable values for the attachment rates and recombination coefficients at these high altitudes are discussed. Example calculations are given involving studies into red sprites. However, the modeling and parameters are not restricted to these events, and might well be useful in a number of other modeling problems.