Joint photometric and geometric image registration in the total least square sense
Joint photometric and geometric image registration in the total least square sense
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DOI:
10.1016/j.patrec.2011.08.004
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发表时间:
2011-11
期刊:
影响因子:
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通讯作者:
H. Luong;B. Goossens;A. Pižurica;W. Philips
中科院分区:
文献类型:
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作者:
H. Luong;B. Goossens;A. Pižurica;W. Philips
This paper presents a novel robust image alignment technique that performs joint geometric and photometric registration in the total least square (TLS) sense. Therefore, we employ the total least square metric instead of the ordinary least square (OLS) metric, which is commonly used in the literature. While the OLS model is sufficient to tackle geometric registration problems, it gives no mutually consistent estimates when dealing with photometric deformations. By introducing a new TLS model, we obtain mutually consistent parameters. Experimental results show that our method is indeed more consistent and accurate in presence of noise compared to existing joint registration algorithms.