Nonlinear IV panel unit root testing under structural breaks in the error variance
Nonlinear IV panel unit root testing under structural breaks in the error variance
复制标题
误差方差结构断裂下的非线性 IV 面板单位根测试
DOI:
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发表时间:
2013
期刊:
影响因子:
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通讯作者:
C. Hanck
中科院分区:
文献类型:
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作者:
M. Demetrescu;C. Hanck
The paper examines the behavior of a generalized version of the nonlinear IV unit root test proposed by Chang (2002) when the series’ errors exhibit nonstationary volatility. The leading case of such nonstationary volatility concerns structural breaks in the error variance. We show that the generalized test is not robust to variance changes in general, and illustrate the extent of the resulting size distortions in finite samples. More importantly, we show that pivotality is recovered when using Eicker-White heteroskedasticity-consistent standard errors. This contrasts with the case of Dickey-Fuller unit root tests, for which Eicker-White standard errors do not produce robustness and thus require computationally costly corrections such as the (wild) bootstrap or estimation of the so-called variance profile. The pivotal versions of the generalized IV tests – with or without the correct standard errors – do however have no power in $$1/T$$-neighbourhoods of the null. We also study the validity of panel versions of the tests considered here.