Time-resolved imaging of current-induced domain-wall oscillations
Time-resolved imaging of current-induced domain-wall oscillations
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DOI：
10.1103/physrevb.78.180405
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发表时间：
2008-11-01
影响因子：
3.7
通讯作者：
Meier, Guido
中科院分区：
文献类型：
--
作者：
Bocklage, Lars;Krueger, Benjamin;Meier, Guido
通过高分辨率软 X 射线透射显微镜，采用频闪泵浦探针测量方案，以 200 ps 的时间分辨率研究电流引起的畴壁动力学。坡莫合金微结构恢复电位中的 180 度畴壁被纳秒电流脉冲从其平衡位置移开，导致速度高达 325 m/s 的振荡。壁的运动是用非谐波势下的刚性畴壁的分析模型来描述的，从而允许确定畴壁的质量。我们表明，奥斯特场在我们的几何结构中主导着畴壁动力学。
Current-induced domain-wall dynamics is investigated via high-resolution soft x-ray transmission microscopy by a stroboscopic pump-and-probe measurement scheme at a temporal resolution of 200 ps. A 180 degrees domain wall in a restoring potential of a permalloy microstructure is displaced from its equilibrium position by nanosecond current pulses leading to oscillations with velocities up to 325 m/s. The motion of the wall is described with an analytical model of a rigid domain wall in a nonharmonic potential allowing one to determine the mass of the domain wall. We show that Oersted fields dominate the domain-wall dynamics in our geometry.