Measurement of absolute detection efficiencies of a microchannel plate detector using charge transfer reaction.
Measurement of absolute detection efficiencies of a microchannel plate detector using charge transfer reaction.
复制标题
使用电荷转移反应测量微通道板检测器的绝对检测效率。
DOI：
10.1088/0031-8949/2011/t144/014057
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发表时间：
2011
期刊：
影响因子：
2.9
通讯作者：
and Y. Haruyama
中科院分区：
文献类型：
--
作者：
N.Takahashi;S. Hosokawa;M.Saito;and Y. Haruyama
提出了一种确定微通道板探测器绝对探测效率的新方法。该方法利用电荷转移反应，不仅可用于确定离子的检测效率，还可用于确定中性原子的检测效率。在0.5-4.8 keV能量范围内对Ar+和中性稀有气体原子（Ne、Ar、Kr和Xe）进行了测量。所有物种的检测效率随着撞击能量的增加而增加，并接近所使用的MCP的开口面积比（约50%）。测得的检测效率与Lindhard，Scharff和Schiott公式在千电子伏能量的电子阻止功率成比例。
A new method for determining the absolute detection efficiencies of a microchannel plate (MCP) detector is presented. This method uses a charge transfer reaction and can be applied to determine not only the detection efficiencies for ions but also those for neutral atoms. The measurements were carried out for Ar+ and neutral rare gas atoms (Ne, Ar, Kr and Xe) in the 0.5–4.8 keV energy range. The detection efficiencies for all species increase with increasing impact energy and approach the open area ratio of the MCP used (about 50%). The measured detection efficiencies were found to scale with the Lindhard, Scharff and Schiott formula for electronic stopping power at keV energies.