Effect of randomness on surface critical phenomena.

Effect of randomness on surface critical phenomena.
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随机性对表面临界现象的影响。

DOI:
10.1103/physrevb.46.5917
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发表时间:
1992
期刊:
Physical Review B (Condensed Matter)
影响因子:
--
通讯作者:
Okabe
Okabe
中科院分区:
--
文献类型:
--
作者:
Ohno;Okabe

文献摘要

被引文献

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研究了具有高斯随机性的S4模型的表面临界现象.利用重整化群四维展开,我们得到了表征随机不动点处关联函数η_random和η_random衰减的表面临界指数.计算了普通跃迁和特殊跃迁的二阶指数,并确定了该随机系统的表面标度关系η random =2η random -η random
We study surface critical phenomena of the S 4 model having Gaussian randomness. Using the renormalization-group 4-d expansion, we obtain surface critical exponents indicating the decay of the correlation function, η ∥ random and η ⊥ random , at the random fixed point. These exponents are evaluated for both the ordinary and special transitions up to the second order, and the surface scaling relation η random =2η ⊥ random -η ∥ random is confirmed in this random system