Probing nanoscale oxygen ion motion in memristive systems.
Probing nanoscale oxygen ion motion in memristive systems.
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探测忆阻系统中的纳米级氧离子运动
DOI：
10.1038/ncomms15173
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发表时间：
2017-05-04
影响因子：
16.6
通讯作者：
Huang R
中科院分区：
文献类型：
--
作者：
Yang Y;Zhang X;Qin L;Zeng Q;Qiu X;Huang R
离子输运是能量存储、传感、显示、记忆等多种应用的重要过程，但氧离子运动的直接可视化一直是一项具有挑战性的任务，这是因为通常使用的电子显微镜成像主要集中在离子的质量属性上。由于缺乏对氧离子运动的适当认识和分析方法，使得揭示氧化基记忆电阻器的机理存在很大困难。在这里，我们通过测量探针和样品之间的静电力梯度来证明氧离子在hfo2中的迁移和积累，并通过充电时间、氧气喷发和使用不同电解质、场方向和环境的对照研究系统地验证了这一点。在较高的电压下，形成缺氧纳米细丝，如直接识别采用cs校正透射电子显微镜。该研究为研究纳米尺度上的离子运动提供了一种通用的方法。
Ion transport is an essential process for various applications including energy storage, sensing, display, memory and so on, however direct visualization of oxygen ion motion has been a challenging task, which lies in the fact that the normally used electron microscopy imaging mainly focuses on the mass attribute of ions. The lack of appropriate understandings and analytic approaches on oxygen ion motion has caused significant difficulties in disclosing the mechanism of oxides-based memristors. Here we show evidence of oxygen ion migration and accumulation in HfO2byin situmeasurements of electrostatic force gradient between the probe and the sample, as systematically verified by the charge duration, oxygen gas eruption and controlled studies utilizing different electrolytes, field directions and environments. At higher voltages, oxygen-deficient nano-filaments are formed, as directly identified employing a CS-corrected transmission electron microscope. This study could provide a generalized approach for probing ion motions at the nanoscale.