Diamond anvil cell measurement of high-pressure yield strength of vanadium using in situ thickness determination

Diamond anvil cell measurement of high-pressure yield strength of vanadium using in situ thickness determination
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DOI:
10.1103/physrevb.81.134107
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发表时间:
2010-04
期刊:
影响因子:
3.7
通讯作者:
J. Klepeis;H. Cynn;W. Evans;R. Rudd;Lin H. Yang;H. Liermann;Wenge Yang
J. Klepeis;H. Cynn;W. Evans;R. Rudd;Lin H. Yang;H. Liermann;Wenge Yang
中科院分区:
物理与天体物理2区
文献类型:
--
作者:
J. Klepeis;H. Cynn;W. Evans;R. Rudd;Lin H. Yang;H. Liermann;Wenge Yang

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The pressure dependence of the quasistatic yield strength of vanadium in polycrystalline foils and powders has been measured up to 90 GPa at room temperature using an implementation of a nonhydrostatic diamond-anvil cell technique, an extension of the technique of Meade and Jeanloz [C. Meade and R. Jeanloz, J. Geophys. Res. 93, 3261 (1988)]. A feature present in this work is the use of an in situ determination of the sample thickness and pressure profile using synchrotron x-ray techniques, allowing a determination of the strength at each point across the sample. Following an initial increase in the strength with pressure, a decrease in the strength of vanadium was observed starting at {approx}40-50 GPa. The softening of the yield strength of vanadium at high pressure is quite surprising and unusual, following the trend of an unusual softening of the shear modulus associated with a subtle phase transition from body-centered-cubic-to-rhombohedral structure in a recent x-ray diffraction experiment.