A new microtomographic technique for non-invasive evaluation of the bone structure around implants
A new microtomographic technique for non-invasive evaluation of the bone structure around implants
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DOI：
10.1034/j.1600-0501.2001.012001091.x
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发表时间：
2001-02-01
影响因子：
4.3
通讯作者：
Pasop, F
中科院分区：
文献类型：
--
作者：
Sennerby, L;Wennerberg, A;Pasop, F
A new X-ray microtomographic technique for non-invasive assessment of the structure of bone surrounding implants was tested. Three titanium microimplants retrieved directly (n=2) or 6 months (n=1) after insertion in 3 patients were used as test samples. Two samples were used dry and one was embedded in plastic resin prior to microtomography. The technique provided high-resolution consecutive cross-sectional X-ray images of the specimens with a slice-to-slice distance of 4.4 to 11.0 mum. The pictures could be imported into an image analysing software with which semiautomatic quantitative measurement of the bone area and three-dimensional images of the specimens could be made. It is suggested that the technique may be used for noninvasive assessment of the bone structure around implants. Further studies are needed to evaluate the accuracy of the technique, for instance by comparing tomographic sections with histologic ones.
