Metal-assisted secondary ion mass spectrometry: Influence of Ag and Au deposition on molecular ion yields
Metal-assisted secondary ion mass spectrometry: Influence of Ag and Au deposition on molecular ion yields
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DOI：
10.1021/ac049108d
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发表时间：
2004-11-15
影响因子：
7.4
通讯作者：
Gijbels, R
中科院分区：
文献类型：
--
作者：
Adriaensen, L;Vangaever, F;Gijbels, R
利用一系列有机染料和一种药物研究了金属沉积对二次离子产额的增强作用。这些分子溶解在甲醇中，然后旋转浇铸在硅衬底上。随后，将银或金蒸发到样品上以产生非常薄的涂层。涂层的样品，当测量与飞行时间-二次离子质谱，表现出相当大的增加，特征二次离子强度。金蒸发样品似乎表现出最高的信号增强。金属化技术的一个主要优点是它可以用于真实的世界样品。特别是，可以研究含有有机晶体的添加剂;然而，在任何给定时刻都不会出现观察到的信号增加。金属沉积在样品表面和测量的样品与TOF-SIMS之间的时间出现的二次离子强度的增强有重要的影响。因此，在样品制备后的不同时间测量金属涂覆的样品。结果表明，取决于样品和沉积的金属，二次离子信号在不同的时间达到最大值。需要进一步研究以揭示所观察到的增强效应的机制。
A series of organic dyes and a pharmaceutical are used to study secondary ion yield enhancement by metal deposition. The molecules were dissolved in methanol and spin-casted on silicon substrates. Subsequently, silver or gold was evaporated onto the samples to produce a very thin coating. The coated samples, when measured with TOF-SIMS, showed a considerable increase in characteristic secondary ion intensity. Gold evaporated samples appeared to exhibit the highest signal enhancement. A major advantage of the metallization technique is that it can be used on real world samples. In particular, additive containing organic crystals could be studied; however, the observed signal increase does not occur at any given moment. The time between metal deposition on the sample surface and the measurement of the sample with TOf-SIMS appears to have an important influence on the enhancement of the secondary ion intensities. Therefore, the metal-coated samples were measured at different times after sample preparation. The results show that, depending on the sample and the metal deposited, the secondary ion signals reach their maximum at different times. Further study will be necessary to reveal the mechanism responsible for the observed enhancement effect.