High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy
High potential sensitivity in heterodyne amplitude-modulation Kelvin probe force microscopy
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DOI：
10.1063/1.4723697
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发表时间：
2012-05-28
影响因子：
4
通讯作者：
Li, Yan Jun
中科院分区：
文献类型：
--
作者：
Sugawara, Yasuhiro;Kou, Lili;Li, Yan Jun
提出了一种利用调幅外差技术测量表面电位的方法。开尔文探针力显微镜和静电力光谱测量中悬臂和样品之间的杂散电容的影响几乎完全消除，因为调制静电力的距离（z）依赖性从1/z增加到1/z（2）。该方法提高了短程力的灵敏度，并减少了由地形反馈引起的表面电位测量串扰。由于真空下悬臂梁Q值高，该方法具有高电位灵敏度的优点。定量表面电位测量证明。(C)2012年美国物理学会。[http：//dx.doi.org/10.1063/1.4723697]
A surface potential measurement method using amplitude-modulation and heterodyne techniques is proposed. The effect of the stray capacitance between a cantilever and a sample in Kelvin probe force microscopy and the electrostatic force spectroscopy measurements are almost completely removed, because the distance (z) dependence of the modulated electrostatic force increases from 1/z to 1/z(2). This method improves the sensitivity of short range forces and reduces the surface potential measurement crosstalk that is induced by topographic feedback. This method has the advantage of high potential sensitivity due to the high cantilever Q value under vacuum. Quantitative surface potential measurements are demonstrated. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4723697]