Microstructure and magnetic properties of Ag/FePt double layer films with different cooling processes
Microstructure and magnetic properties of Ag/FePt double layer films with different cooling processes
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DOI：
10.1016/j.jallcom.2008.09.098
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发表时间：
2009-05
影响因子：
6.2
通讯作者：
K. Dong;Xiaofei Yang;Jun-bing Yan;W. Cheng;Xiaomin Cheng;X. Miao;Xiaohong Xu;Fang Wang
中科院分区：
文献类型：
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作者：
K. Dong;Xiaofei Yang;Jun-bing Yan;W. Cheng;Xiaomin Cheng;X. Miao;Xiaohong Xu;Fang Wang
采用射频磁控溅射法在Corning玻璃基片上沉积了不同Ag厚度的Ag/FePt双层膜，并对沉积后的样品进行不同冷却方式的真空退火，制备了L10-FePt薄膜。实验结果表明，在制备具有高垂直各向异性的薄膜时，Ag层的厚度是一个非常重要的因素。40 nm Ag/15 nm FePt薄膜具有9053 Oe的高垂直极化率和6059 Oe的低面内极化率。自然冷却的Ag/FePt双层膜比快速冷却的Ag/FePt双层膜具有更大的Mr/Ms值。厚度为15 nm的FePt薄膜的磁化率随角度的变化曲线显示出典型的畴壁运动行为，而厚度为15 nm的FePt薄膜和40 nm Ag/15 nm FePt双层薄膜的磁化率随角度的变化曲线均显示出旋转模式，表明40 nm Ag/15 nm FePt薄膜中的晶粒是弱耦合的，并且它们的磁化反转是独立的。
Ag/FePt double layer films with different Ag thicknesses were deposited on Corning glass substrates by RF magnetron sputtering and L10-FePt films were prepared after the as-deposited samples were subjected to vacuum annealing with different cooling processes. Experimental results show that the thickness of the Ag layer is a very important factor in preparing the film with a high perpendicular anisotropy. The 40nm Ag/15nm FePt film exhibits a high perpendicular coercivity of 9053Oe and a low in-plane coercivity of 6059Oe. The Ag/FePt double layer films with natural cooling have larger Mr/Ms values than those with fast cooling processes. The angular dependence of the coercivity profile for the FePt film with a thickness of 15nm shows a typical domain wall motion behavior, while both the simulated curve of FePt film of 15nm and the one of 40nm Ag/15nm FePt double layer film revealed the rotation mode, which indicates that the grains are weakly coupled and their reversals of magnetizations are independent in the 40nm Ag/15nm FePt film.