On the feasibility to study inverse proximity effect in a single S/F bilayer by Polarized Neutron Reflectometry
On the feasibility to study inverse proximity effect in a single S/F bilayer by Polarized Neutron Reflectometry
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偏振中子反射法研究单层S/F双层逆邻近效应的可行性
DOI：
10.1134/s0021364013150101
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发表时间：
2013
期刊：
影响因子：
1.3
通讯作者：
V. Aksenov
中科院分区：
文献类型：
--
作者：
Y. Khaydukov;B. Nagy;J. H. Kim;T. Keller;A. Rühm;Y. Nikitenko;K. N. Zhernenkov;J. Stahn;L. Kiss;A. Csík;L. Bottyán;V. Aksenov
在这里，我们报告的可行性研究，旨在探索潜在的极化中子反射（PNR）检测在一个单一的超导/铁磁双层的逆邻近效应。在V（40 nm）/Fe（1 nm）S/F双层上进行的实验已经表明，与在T = 1.5TC下测量的曲线相比，在T = 0.5TC下测量的实验自旋不对称性向更高的Q值偏移。这种位移可以通过在超导钒中出现厚度为7 nm、磁化强度为+0.8 kG的磁性子层来描述。
Here we report on a feasibility study aiming to explore the potential of Polarized Neutron Reflectometry (PNR) for detecting the inverse proximity effect in a single superconducting/ferromagnetic bilayer. Experiments, conducted on the V (40 nm)/Fe (1 nm) S/F bilayer, have shown that experimental spin asymmetry measured at T = 0.5TC is shifted towards higher Q values compared to the curve measured at T = 1.5TC. Such a shift can be described by the appearance in superconducting vanadium of magnetic sublayer with a thickness of 7 nm and a magnetization of +0.8 kG.