A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits
A Reliability-Critical Path Identifying Method With Local and Global Adjacency Probability Matrix in Combinational Circuits
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DOI：
10.1109/tc.2023.3323772
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发表时间：
2024-01
影响因子：
3.7
通讯作者：
Zhanhui Shi;Jie Xiao;Weidong Zhu;Jianhui Jiang
中科院分区：
文献类型：
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作者：
Zhanhui Shi;Jie Xiao;Weidong Zhu;Jianhui Jiang
可靠性关键路径（RCP）的准确和有效的识别不仅有助于故障定位和故障排除，而且还允许电路设计人员以低成本提高电路的可靠性。本文提出了一种基于局部和全局邻接概率矩阵的方法（LGAPM），以快速有效地识别组合逻辑电路的RCP。该方法既反映了电路整体可靠性的关键性，又反映了路径中门的局部关键性。此外，我们设计了一种基于剪枝的方法来加速大规模电路RCP的识别。在全部74个串联电路、ISCAS-85电路和EPFL部分基准电路上的实验结果表明，最少17路的74181电路和最多8.081 × 108路的EPFL-10电路的实验时间分别约为0.18s和33931.04s。在中小规模电路上的平均精度为94.24%，在所有规模电路上的平均稳定性为86.19%。与基于SAT的方法、爬山算法和随机方法相比，LGAPM的度量具有上级优势，更适合于大规模电路。通过在确定的最多的RCP中硬化少量的门，可以将电路的整体可靠性平均从0.7726提高到0.9238，并且平均节省成本是随机硬化方法的4.08倍。
Accurate and efficient identification of reliability-critical paths (RCPs) not only facilitates fault localization and troubleshooting but also allows circuit designers to improve circuit reliability at a low cost. This article proposes a local and global adjacency probability matrix-based approach (LGAPM) to quickly and efficiently identify RCPs of combinational logic circuits. The approach reflects the criticality of the overall reliability of the circuit as well as the local criticality of gates in the path. In addition, we design a pruning-based method to accelerate RCP identification in large-scale circuits. The experimental results of the LGAPM on all 74 series circuits, ISCAS-85, and partial EPFL benchmark circuits show that the 74181 circuit with a minimum of 17 paths and the EPFL-remainder10 circuit with a maximum of 8.081 × 108 paths take times of about 0.18s and 33931.04s, respectively. The average accuracy on small and medium-scale circuits is 94.24%, and the average stability on all-size circuits is 86.19%. Compared to the SAT-based method, hill-climbing algorithm, and random method, LGAPM’s metrics are superior and more appropriate for large-scale circuits. The overall circuit reliability can be improved from 0.7726 to 0.9238 on average by hardening a tiny number of gates in the identified the most RCPs and the average cost savings is 4.08 times over random hardening methods.