Film thickness dependence of phase separation and dewetting behaviors in PMMA/SAN blend films.

Film thickness dependence of phase separation and dewetting behaviors in PMMA/SAN blend films.
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DOI:
10.1021/la102680b
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发表时间:
2010-09
期刊:
Langmuir : the ACS journal of surfaces and colloids
影响因子:
--
通讯作者:
Jichun You;Yonggui Liao;Yongfeng Men;T. Shi;L. An
Jichun You;Yonggui Liao;Yongfeng Men;T. Shi;L. An
中科院分区:
其他
文献类型:
--
作者:
Jichun You;Yonggui Liao;Yongfeng Men;T. Shi;L. An

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通过掠入射超小角 X 射线散射 (GIUSAX) 和原位原子力显微镜 (AFM) 研究了 175 °C 氧化硅基底上的共混物 [聚甲基丙烯酸甲酯 (PMMA) 和聚 (苯乙烯-丙烯腈) (SAN)] 薄膜中相分离和去湿耦合的复杂行为的薄膜厚度依赖性。结果发现,去湿路径受参数U(q0)/E控制,该参数分别描述了表面起伏的初始幅度和薄膜的原始厚度。此外,我们的结果表明,相分离和去湿之间的相互作用很大程度上取决于膜厚度。详细讨论了去湿-相分离/润湿、去湿/润湿-相分离和相分离/润湿-伪去湿三种机制。总之,相分离和去湿的相对速率决定了它们之间的相互作用。
Film thickness dependence of complex behaviors coupled by phase separation and dewetting in blend [poly(methyl methacrylate) (PMMA) and poly(styrene-ran-acrylonitrile) (SAN)] films on silicon oxide substrate at 175 °C was investigated by grazing incidence ultrasmall-angle X-ray scattering (GIUSAX) and in situ atomic force microscopy (AFM). It was found that the dewetting pathway was under the control of the parameter U(q0)/E, which described the initial amplitude of the surface undulation and original thickness of film, respectively. Furthermore, our results showed that interplay between phase separation and dewetting depended crucially on film thickness. Three mechanisms including dewetting-phase separation/wetting, dewetting/wetting-phase separation, and phase separation/wetting-pseudodewetting were discussed in detail. In conclusion, it is relative rates of phase separation and dewetting that dominate the interplay between them.