Doping and stress induced failure of Ti(Al/Pt)N films on Ti6Al4V plate in a simulated PEMFC environment
Doping and stress induced failure of Ti(Al/Pt)N films on Ti6Al4V plate in a simulated PEMFC environment
复制标题
DOI:
10.1016/j.surfcoat.2022.128478
复制
发表时间:
2022
期刊:
影响因子:
--
通讯作者:
Dong-xu Chen
中科院分区:
文献类型:
--
作者:
Feng Du;Yan-wen Zhou;Ying-han Wang;Fang Fang;Jun-sheng Wu;Kai-ce Zhang;Cheng Guo;Dong-xu Chen