The relative accuracy of ionogram analysis techniques
The relative accuracy of ionogram analysis techniques
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DOI：
10.1029/rs010i006p00589
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发表时间：
1975-06
期刊：
影响因子：
1.6
通讯作者：
J. Titheridge
中科院分区：
文献类型：
--
作者：
J. Titheridge
通过增加用于在测量点之间进行插值的多项式的阶数，可以提高h′（f）到N（h）轮廓转换的精度。线性和抛物线叠层技术对应于一阶和二阶插值。四阶插值（如5项重叠多项式方法）是最佳的。在比较不同的方法时，必须采用固定的边界条件;这样做时，相邻多项式技术比重叠多项式精确得多。所有方法（包括最小二乘法）对虚拟高度数据中的误差同样敏感。可能的程序，以减少潜在的和谷电离所造成的错误进行了严格审查。它的结论是，在一般情况下，只有一个单一的参数是必要的或可取的描述这些地区。这个参数可以从任何纬度的寻常和非常射线测量中确定。
Increasing accuracy in the conversion of h′(f) to N(h) profiles is obtained by increasing the order of the polynomial used to interpolate between measured points. Linear and parabolic lamination techniques correspond to first- and second-order interpolation. Fourth-order interpolation (as in the 5-term overlapping polynomial method) is about optimum. In comparing different methods, it is essential that fixed boundary conditions be employed; when this is done an adjacent polynomial technique is much less accurate than overlapping polynomials. All methods (including least-squares procedures) are equally sensitive to errors in the virtual height data. Possible procedures for reducing the errors caused by underlying and valley ionization are critically reviewed. It is concluded that, in general, only a single parameter is necessary or desirable to describe these regions. This parameter can be determined from ordinary and extraordinary ray measurements, at any latitude.