Degradation and Its Control of Ultraviolet Avalanche Photodiodes Using PEDOT:PSS/ZnSSe Organic–Inorganic Hybrid Structure
Degradation and Its Control of Ultraviolet Avalanche Photodiodes Using PEDOT:PSS/ZnSSe Organic–Inorganic Hybrid Structure
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DOI：
10.1007/s11664-018-6365-8
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发表时间：
2018-05
影响因子：
2.1
通讯作者：
T. Abe;S. Uchida;Keita Tanaka;Takanobu Fujisawa;H. Kasada;K. Ando;K. Akaiwa;K. Ichino
中科院分区：
文献类型：
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作者：
T. Abe;S. Uchida;Keita Tanaka;Takanobu Fujisawa;H. Kasada;K. Ando;K. Akaiwa;K. Ichino
我们研究了PEDOT：PSS/ZnSSe有机-无机混合紫外雪崩光电二极管（UV-APD）的器件退化。采用分子束外延技术生长ZnSSe/n-GaAs晶片，用喷墨技术制备PEDOT：PSS窗口层。在N2（4 N）气氛中，我们观察到APD模式应力（~ 30 V）的快速降解，而我们观察到正向偏置电流应力和光电流应力没有显著变化。在真空条件下，我们没有观察到可检测的退化的APD模式应力的暗雪崩电流。因此，在APD模式应力下PEDOT：PSS/ZnSSe界面的退化是由N2气氛中残留的水蒸气或氧气引起的，可以通过真空封装来控制。
We investigated device degradation in PEDOT:PSS/ZnSSe organic–inorganic hybrid ultraviolet avalanche photodiodes (UV-APDs). ZnSSe/n-GaAs wafers were grown by molecular beam epitaxy, and PEDOT:PSS window layers were formed by inkjet technique. We observed rapid degradation with APD-mode stress (~ 30 V) in the N2(4 N) atmosphere, while we observed no marked change in forward bias current stress and photocurrent stress. In the case of a vacuum condition, we observed no detectable degradation in the dark avalanche current with APD-mode stress. Therefore, the degradation in the PEDOT:PSS/ZnSSe interface under the APD-mode stress was caused by the residual water vapor or oxygen in the N2atmosphere and could be controlled by vacuum packaging.