Silicon emitter for field desorption mass spectrometry
Silicon emitter for field desorption mass spectrometry
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用于场解吸质谱分析的硅发射器
DOI:
10.1021/ac50037a025
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发表时间:
1979
影响因子:
7.4
通讯作者:
I. Katakuse
中科院分区:
文献类型:
--
作者:
T. Matsuo;H. Matsuda;I. Katakuse
A new ion emitter for field ionization and desorption mass spectrometry has been developed. Very fine silicon whiskers grown on a 60-µ (diameter) tungsten (or tantalum) wire can be used as a strong and efficient emitter. The process of growth is as follows. A small amount of gold Is deposited by evaporation on 60-µ tungsten wire. After being preheated in a vacuum chamber, the gold coated tungsten wire is heated by direct electric current in silane gas (SiH4 5%+ Ar 95%) at a pressure of 180 Torr. Silicon whiskers grow in about 1 min. Pre-treatment, careful control, and high voltage supply during the whisker growth are unnecessary. The total ionizing efficiencies of silicon emitters in FI operation and in FD operation have been measured. The ionization efficiency for acetone in FI operation was 5 X 10 “® A/Torr and that for AMP in FD operation was 1.4 X10 “12 C/pg. The results for other test samples are also described.