Revisit Steganalysis on QIM-Based Data Hiding
Revisit Steganalysis on QIM-Based Data Hiding
复制标题
DOI：
10.1109/iih-msp.2009.316
复制
发表时间：
2009-09
期刊：
影响因子：
--
通讯作者：
Qinxia Wu;Weiping Li;X. Yu
中科院分区：
文献类型：
--
作者：
Qinxia Wu;Weiping Li;X. Yu
本文利用机器视觉和图像处理技术，开发了多层陶瓷电容器（MLCC）尺寸和外观的图像检测流程，并将所提出的自动光学检测（AOI）系统应用于MLCC生产线上。比较了Hough变换和直方图分析的优缺点。提出的微小无源元件检测流程可以在获得元件图像信息的同时，真实的实时地对每个电容进行缺陷检测。如果在检测流程中能够发现缺陷，则可以立即判断并将其归类为不良部件，并且可以显著减少每个部件的检测时间。
In this paper, we utilized machine vision and image processing to develop an image detection flow for the dimension and appearance of multilayer ceramic capacitors (MLCC), and also used proposed automatic optical inspection (AOI) system in the MLCC production line operation. We compared the advantages and disadvantages of Hough Transform and Histogram analysis. The proposed tiny passive components detection flow can execute the defect detection of each capacitor in real time as soon as the image information of the component is obtained. If defect can be found on the detection flow, it can be immediately judged and classified into defective components, and detection time of each component can be significantly reduced.