Infrared Absorption Imaging of Water Ingress Into the Encapsulation of (Opto-)Electronic Devices
Infrared Absorption Imaging of Water Ingress Into the Encapsulation of (Opto-)Electronic Devices
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DOI：
10.1109/jphotov.2018.2877883
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发表时间：
2019-01
影响因子：
3
通讯作者：
J. Hepp;A. Vetter;S. Langner;M. Woiton;G. Jovicic;K. Burlafinger;J. Hauch;C. Camus;H. Egelhaaf;C. Brabec
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文献类型：
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作者：
J. Hepp;A. Vetter;S. Langner;M. Woiton;G. Jovicic;K. Burlafinger;J. Hauch;C. Camus;H. Egelhaaf;C. Brabec
水进入电子器件的封装是一个严重的问题，特别是对于有机和钙钛矿基电子器件。为了指导合适的阻隔材料和设计的开发，需要一种可靠、快速和非破坏性的分析工具。在这项工作中，成像设置，这是基于选择性的红外（IR）辐射源和中红外敏感相机，使用水的吸收带约1920 nm和参考带。该系统使我们能够监测设备包装内的水浓度分布及其随时间的变化。我们的测量能够检测各种封装材料中低至mg/m2浓度范围的水的局部存在。新工具允许识别湿气进入封装的路径以及相应的扩散系数沿着。因此，它提供了与湿度相关的故障机制的快速和可靠的分析，从而有助于改进封装材料和工艺的设计。
Water ingress into the encapsulation of electronic devices is a serious issue, especially for organic and perovskite-based electronics. In order to guide the development of suitable barrier materials and design, a reliable, fast, and non-destructive analysis tool is required. In this work, an imaging setup is presented, which is based on selective infrared (IR) radiation sources and a mid- IR sensitive camera that uses the absorption band of water around 1920 nm and a reference band. This system enables us to monitor the distribution of water concentration inside the packaging of devices and its change over time. Our measurement is capable of detecting the local presence of water down to the mg/m2 concentration range in a wide variety of encapsulation materials. The new tool allows identifying the pathways of moisture ingress into the encapsulation along with the corresponding diffusion coefficient. Thus, it provides fast and reliable analysis of humidity related failure mechanisms, and consequently helps to improve the design of encapsulation materials and processes.