Irradiation study of a fully monolithic HV-CMOS pixel sensor design in AMS 180 nm
Irradiation study of a fully monolithic HV-CMOS pixel sensor design in AMS 180 nm
复制标题
DOI:
10.1016/j.nima.2018.07.044
复制
发表时间:
2017-12
期刊:
影响因子:
--
通讯作者:
H. Augustin;N. Berger;S. Dittmeier;J. Hammerich;A. Herkert;L. Huth;D. Immig;J. Kroger;F. Meier;I. Peri'c;A. Perrevoort;A. Schoning;D. Bruch;D. Wiedner
中科院分区:
文献类型:
--
作者:
H. Augustin;N. Berger;S. Dittmeier;J. Hammerich;A. Herkert;L. Huth;D. Immig;J. Kroger;F. Meier;I. Peri'c;A. Perrevoort;A. Schoning;D. Bruch;D. Wiedner
Abstract High-Voltage Monolithic Active Pixel Sensors (HV-MAPS) based on a 180 nm HV-CMOS process have been proposed to realize thin, fast and highly integrated pixel sensors. The MuPix7 prototype, fabricated in the commercial AMS H18 process, features a fully integrated on-chip readout, ie hit-digitization, zero suppression and data serialization. MuPix7 is the first fully monolithic HV-CMOS pixel sensor that has been tested for the use in high irradiation environments like HL-LHC. We present results from laboratory and test beam measurements of MuPix7 prototypes irradiated with neutrons (up to 5.0× 10 15 n eq/cm 2) and 24 GeV protons (up to 7.8× 10 15 protons/cm 2) and compare the performance with non-irradiated sensors. At sensor temperatures of about 8° C efficiencies of≥ 90% at noise rates below 40 Hz per pixel are measured for fluences of up to 1.5× 10 15 n eq/cm 2. A time resolution better than 22 ns, expressed as Gaussian σ, is measured for all tested settings and sensors, even at the highest irradiation fluences. The data transmission at 1.25 Gbit/s and the on-chip PLL remain fully functional.