All-Back-Contact Perovskite Solar Cells Using Cracked Film Lithography
All-Back-Contact Perovskite Solar Cells Using Cracked Film Lithography
复制标题
DOI:
10.1021/acsaem.2c01298
复制
发表时间:
2022-07-25
影响因子:
6.4
通讯作者:
Wheeler, Lance M.
中科院分区:
文献类型:
--
作者:
Prince, Kevin J.;Muzzillo, Christopher P.;Wheeler, Lance M.
All-back-contact perovskite solar cells promise greater power conversion efficiency compared to conventional planar device architectures. However, the best-performing devices to date use photolithography to fabricate electrodes, which is expensive for deployment and a barrier for research facilities. Herein, we utilize cracked film lithography, a solution-processed micropatterning technique, to form an interconnected, defect-tolerant back-contact electrode network. We introduce a crack widening technique to control the optical transparency and sheet resistance while decoupling the relative areas of the electron and hole contacts in the back-contact network. Wider cracks increase the area of the hole-selective contact, which increases photocurrent and power conversion efficiency.