AFLP Analysis of Arabidopsis Thaliana Treated by Low-Energy Ion Beam
AFLP Analysis of Arabidopsis Thaliana Treated by Low-Energy Ion Beam
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DOI：
10.1109/tps.2007.893267
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发表时间：
2007-04
影响因子：
1.5
通讯作者：
Ke-ming Li;Y. Nie;Dongzheng Zhang;Jun Zhang;Genfa Zhang
中科院分区：
文献类型：
--
作者：
Ke-ming Li;Y. Nie;Dongzheng Zhang;Jun Zhang;Genfa Zhang
The mutagenic effects of ion implantation on arabidopsis thaliana were analyzed using an amplified fragment length polymorphism (AFLP) fingerprinting. The mutagenic effect of the C+ ion was on top of that of N+ at the same fluence. Sequence analysis of variant DNA fragments indicated that the transformation of bases appeared to be the dominant type of mutations induced by ion implantation. Molecular positional effect on mutagenesis arising from ion implantation was observed. The sequence composition of purine and pyrimidine bases flanking the mutation site had a major impact on the determination of transformation types. The mutations in a functional gene induced by the ion implantation were analyzed via molecular cloning and sequencing of mutant fragments by the AFLP
