Successful optimization of reconstruction parameters in structured illumination microscopy - A practical guide
Successful optimization of reconstruction parameters in structured illumination microscopy - A practical guide
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DOI：
10.1016/j.optcom.2018.12.005
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发表时间：
2019-04-01
影响因子：
2.4
通讯作者：
Heintzmann, Rainer
中科院分区：
文献类型：
--
作者：
Karras, Christian;Smedh, Maria;Heintzmann, Rainer
详细分析了超分辨率结构照明显微镜（SIM）中不同重建参数对图像伪影的影响。这些参数包括维纳滤波参数、消光函数、零频率抑制和光传递函数的修改。对重建图像的光谱进行了详细的研究，得出了适合于识别伪影的结论。为此，使用两个样本，一个人工测试载玻片和一个更真实的生物系统，来表征伪影类别及其与图像光谱和重建参数的相关性。此外，还提出了有效参数优化的指导方针，并描述了在选定的最新处理包（专有和开源）中参数的实现。
The impact of the different reconstruction parameters in super-resolution structured illumination microscopy (SIM) on image artifacts is carefully analyzed. These parameters comprise the Wiener filter parameter, an apodization function, zero-frequency suppression and modifications of the optical transfer function. A detailed investigation of the reconstructed image spectrum is concluded to be suitable for identifying artifacts. For this purpose, two samples, an artificial test slide and a more realistic biological system, were used to characterize the artifact classes and their correlation with the image spectra as well as the reconstruction parameters. In addition, a guideline for efficient parameter optimization is suggested and the implementation of the parameters in selected up-to-date processing packages (proprietary and open-source) is depicted.