Comparison of fluorescence-based temperature sensor schemes: Theoretical analysis and experimental validation

Comparison of fluorescence-based temperature sensor schemes: Theoretical analysis and experimental validation
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DOI:
10.1063/1.368705
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发表时间:
1998-11-01
影响因子:
3.2
通讯作者:
Palmer, AW
Palmer, AW
中科院分区:
物理与天体物理3区
文献类型:
--
作者:
Collins, SF;Baxter, GW;Palmer, AW

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比较了两种最有前途的基于荧光的温度传感技术,即荧光强度比(FIR)和荧光寿命(FL)方案的性能。这两种方法的理论校准图说明了响应随温度变化的有用的单调变化。两种方案的响应和灵敏度的比较表明,在很低的温度下,FIR方法表现出显着的变化与温度,而FL方法的响应变得恒定,其灵敏度接近零。随着温度的升高,FIR和FL方法(具有较短的弛豫时间和较短的上能级的本征寿命)在很宽的温度范围内具有相似的灵敏度。在FL方法的使用中,长弛豫时间或较长的上能级的本征寿命的存在给出了不太令人满意的响应。在各种主机材料的掺杂剂离子的范围内获得的实验数据被发现是一致的理论预期,与每种材料具有特定的能隙差。每种材料的灵敏度以图形方式进行比较,这将允许为预期应用选择最合适的传感器。(C)1998年美国物理学会。[S0021-8979(98)04821-X]。
The performance of the two most promising fluorescence-based temperature sensing techniques, namely the fluorescence intensity ratio (FIR) and fluorescence lifetime (FL) schemes, have been compared. Theoretical calibration graphs for the two methods illustrate the useful monotonic change of the response with temperature variation. Comparison of the responses and the sensitivities of the two schemes show that at very low temperatures the FIR method exhibits a significant variation with temperature, while the response of the FL method becomes constant with its sensitivity approaching zero. With increasing temperature, the FIR and the FL methods (with short relaxation times and shorter intrinsic lifetimes of the upper energy levels) share a similar sensitivity over a wide temperature range. The presence of a long relaxation time or a longer intrinsic lifetime of the upper level in the use of the FL method gives a less satisfactory response. Experimental data obtained for a range of dopant ions in various host materials are found to be consistent with the theoretical expectation, with each material having a specific energy gap difference. The sensitivities of each material are compared graphically which would allow the most appropriate sensor for an intended application to be selected. (C) 1998 American Institute of Physics. [S0021-8979(98)04821-X].