Patterning of dielectric oxide thin layers by microcontact printing of self-assembled monolayers
Patterning of dielectric oxide thin layers by microcontact printing of self-assembled monolayers
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通过自组装单层微接触印刷形成介电氧化物薄层图案
DOI:
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发表时间:
1995
期刊:
影响因子:
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通讯作者:
D. A. Payne
中科院分区:
文献类型:
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作者:
N. L. Jeon;P. Clem;R. Nuzzo;D. A. Payne
This communication describes a technique used to pattern oxide thin layers using microcontact printing (μCP) and sol-gel deposition. The technique involves μCP of self-assembled monolayers (SAM’s) of alkylsiloxane on various substrates (SiO_2/Si, sapphire, ITO, and glass), followed by deposition of oxide thin layers from sol-gel precursors. Delamination of oxide layers from SAM-derivatized regions allows selective deposition of crystalline dielectric oxide layers on underivatized regions. To demonstrate the viability of this technique for integrated microelectronics and optics applications, patterned (Pb,La)TiO_3 (PLT) and LiNbO_3 layers were deposited on sapphire, silicon, and indium tin oxide (ITO) substrates. Use of lattice-matched substrates allows lithography-free deposition of patterned heteroepitaxial oxide layers. Strip waveguides of heteroepitaxial LiNbO_3 with 4 μm lateral dimensions were fabricated on sapphire. Dielectric measurements for patterned PLT thin layers on ITO are also reported.