Liquid-crystal thermography of hot spots on electronic components
Liquid-crystal thermography of hot spots on electronic components
复制标题
电子元件热点的液晶热成像
DOI：
10.1134/s1063739707060066
复制
发表时间：
2007
影响因子：
--
通讯作者：
N. Moshel
中科院分区：
文献类型：
--
作者：
V. M. Popov;A. S. Klimenko;A. P. Pokanevich;I. Gavrilyuk;N. Moshel
综述了液晶热成像技术在电子元器件失效分析中的热点定位方法。这些方法根据液晶的分子是否对准来分类。确定了它们的应用领域。新的，高度敏感的技术和它们的实现。讨论了集成电路和太阳能电池热点的液晶图像。
A summary is presented of liquid-crystal thermography as a tool for locating hot spots in the failure analysis of electronic components. The methods are categorized according to whether or not the molecules of the liquid crystal are aligned. Their fields of application are identified. New, highly sensitive techniques and their implementations are presented. Liquid-crystal images of hot spots for ICs and solar cells are discussed.